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Susceptibility, Permittivity and Dielectric Constant01:26

Susceptibility, Permittivity and Dielectric Constant

When placed in an external electric field, a dielectric material gets polarized. The charge density in the dielectric material is given by the sum of the bound and free charge densities, while the total charge density can also be written in terms of the total electric field. The bound charge density can be measured in terms of polarization, leading to the relationship between electric displacement and polarization.
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Parallel plate capacitors consist of two conducting plates separated by a certain distance. However, it is mechanically difficult to hold the large plates parallel to each other without actual contact. Hence, a dielectric layer is commonly placed between the plates, which provides an easy solution for holding the plates together with a small gap and increases the capacitance of the capacitor.
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Consider a polar dielectric placed in an external field. In such a dielectric, opposite charges on adjacent dipoles neutralize each other, such that the net charge within the dielectric is zero. When a polar dielectric is inserted in between the capacitor plates, an electric field is generated due to the presence of net charges near the edge of the dielectric and the metal plates interface. Since the external electrical field merely aligns the dipoles, the dielectric as a whole is neutral. An...
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Related Experiment Video

Updated: Jun 26, 2026

Recombination Dynamics in Thin-film Photovoltaic Materials via Time-resolved Microwave Conductivity
11:30

Recombination Dynamics in Thin-film Photovoltaic Materials via Time-resolved Microwave Conductivity

Published on: March 6, 2017

Trace formula for dielectric cavities: general properties.

E Bogomolny1, R Dubertrand, C Schmit

  • 1Université Paris-Sud, CNRS, UMR 8626, Laboratoire de Physique Théorique et Modèles Statistiques, 91405 Orsay Cedex, France.

Physical Review. E, Statistical, Nonlinear, and Soft Matter Physics
|December 31, 2008
PubMed
Summary
This summary is machine-generated.

This study details the trace formula for open dielectric cavities, linking cavity resonances to classical periodic orbits. It introduces a new factor related to boundary reflection coefficients, improving accuracy for convex cavities.

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Method Development for Contactless Resonant Cavity Dielectric Spectroscopic Studies of Cellulosic Paper
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Method Development for Contactless Resonant Cavity Dielectric Spectroscopic Studies of Cellulosic Paper

Published on: October 4, 2019

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Last Updated: Jun 26, 2026

Recombination Dynamics in Thin-film Photovoltaic Materials via Time-resolved Microwave Conductivity
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Recombination Dynamics in Thin-film Photovoltaic Materials via Time-resolved Microwave Conductivity

Published on: March 6, 2017

Method Development for Contactless Resonant Cavity Dielectric Spectroscopic Studies of Cellulosic Paper
05:40

Method Development for Contactless Resonant Cavity Dielectric Spectroscopic Studies of Cellulosic Paper

Published on: October 4, 2019

Area of Science:

  • Mathematical Physics
  • Wave Phenomena
  • Dielectric Resonators

Background:

  • The trace formula connects spectral properties (resonances) with classical dynamics (periodic orbits).
  • Open dielectric cavities present unique challenges due to boundary interactions and radiation losses.

Purpose of the Study:

  • To derive and analyze the trace formula for open dielectric cavities.
  • To relate cavity resonances to classical periodic orbits and boundary reflection properties.
  • To investigate the asymptotic behavior of the resonance counting function.

Main Methods:

  • Application of the Krein formula to transform resonance sums into orbit sums.
  • Analysis of the contribution of individual periodic orbits, including boundary reflection coefficients.
  • Derivation of asymptotic terms for the resonance counting function.

Main Results:

  • The sum over cavity resonances is expressed as a sum over classical periodic orbits.
  • Each orbit's contribution is a product of standard trace formula factors and boundary reflection coefficients.
  • Two asymptotic terms (area and perimeter) for the resonance counting function were derived.
  • The perimeter term coefficient differs from closed cavities due to scattering asymptotics.

Conclusions:

  • The derived trace formula accurately describes open dielectric cavities.
  • The results provide a deeper understanding of wave behavior in open resonant systems.
  • The formulas show good agreement with numerical calculations for circular dielectric cavities.