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Related Experiment Video

Updated: Jun 26, 2026

$Measurements of Long-range Electronic Correlations During Femtosecond Diffraction Experiments Performed on Nanocrystals of Buckminsterfullerene$

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Published on: August 22, 2017

Measuring temporal speckle correlations at ultrafast x-ray sources.

C Gutt¹, L-M Stadler, A Duri

¹Hasylab at DESY, Hamburg, Germany. christian.gutt@desy.de

|January 9, 2009

Summary

Researchers developed a novel method using photon statistics to analyze speckle patterns from coherent diffraction data. This technique extracts the intermediate scattering function for ultrafast correlation spectroscopy at X-ray free-electron laser sources.

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Last Updated: Jun 26, 2026

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Area of Science:

X-ray science
Photonics
Materials science

Background:

Coherent diffraction imaging (CDI) provides structural information.
Extracting dynamic information from CDI is challenging.
Ultrafast processes require advanced spectroscopic techniques.

Purpose of the Study:

To present a new method for extracting the intermediate scattering function (ISF) from coherent diffraction patterns.
To demonstrate the equivalence of this new method to conventional techniques.
To enable correlation spectroscopy on ultrafast timescales.

Main Methods:

Analysis of speckle patterns in coherent diffraction data using photon statistics.
Utilizing 2D detectors for data acquisition.
Comparison with the intensity autocorrelation function method.

Main Results:

Successfully extracted the intermediate scattering function.
Demonstrated that the photon statistics approach yields equivalent information to the intensity autocorrelation function.
Established a viable method for ultrafast dynamics studies.

Conclusions:

The novel photon statistics method offers a powerful tool for analyzing ultrafast dynamics.
This approach is suitable for X-ray free-electron laser (XFEL) sources.
Opens new avenues for correlation spectroscopy at unprecedented timescales.