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Updated: Jun 26, 2026

Preparation of Nanoparticles for ToF-SIMS and XPS Analysis
06:24

Preparation of Nanoparticles for ToF-SIMS and XPS Analysis

Published on: September 13, 2020

Development of a rapid source preparation method for high-resolution alpha-particle spectrometry

H Kikunaga1, Y Kasamatsu, K Takamiya

  • 1RIKEN (The Institute of Physical and Chemical Research), Wako, Saitama 351-0198, Japan. hkiku@chem.sci.osaka-u.ac.jp

Applied Radiation and Isotopes : Including Data, Instrumentation and Methods for Use in Agriculture, Industry and Medicine
|January 13, 2009
PubMed

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