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Updated: Jun 26, 2026

Picometer-Precision Atomic Position Tracking through Electron Microscopy
Published on: July 3, 2021
Advances in atomic resolution in situ environmental transmission electron microscopy and 1A aberration corrected in
Pratibha L Gai1, Edward D Boyes
1Department of Chemistry, University of York, Nanocentre, York YO10 5DD, United Kingdom. pgb500@york.ac.uk
Abstract:
Advances in atomic resolution in situ environmental transmission electron microscopy for direct probing of gas-solid reactions, including at very high temperatures (approximately 2000 degrees C) are described. In addition, recent developments of dynamic real time in situ studies at the Angstrom level using a hot stage in an aberration corrected environment are presented. In situ data from Pt/Pd nanoparticles on carbon with the corresponding FFT/optical diffractogram illustrate an achieved resolution of 0.11 nm at 500 degrees C and higher in a double aberration corrected TEM/STEM instrument employing a wider gap objective pole piece. The new results open up opportunities for dynamic studies of materials in an aberration corrected environment.
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