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Related Concept Videos

Interference and Diffraction02:18

Interference and Diffraction

Interference is a characteristic phenomenon exhibited by waves. When two electromagnetic waves interact with their peaks and troughs coinciding, a resulting wave with enhanced amplitude is produced. This is known as constructive interference. In this case, the two waves interacting are in phase with each other.
Atomic Emission Spectroscopy: Interference01:30

Atomic Emission Spectroscopy: Interference

In atomic emission spectroscopy (AES), high-temperature atomizers excite a broad range of elements and molecules that generate complex emissions from sources such as oxides, hydroxides, and flame combustion products in the flame or plasma. Several strategies can be employed to minimize spectral interferences caused by overlapping emission lines or bands. These include increasing instrument resolution, choosing alternative emission lines, optimally placing the detector in low-background regions,...
Phase Contrast and Differential Interference Contrast Microscopy01:26

Phase Contrast and Differential Interference Contrast Microscopy

Phase-Contrast Microscopes
In-phase-contrast microscopes, interference between light directly passing through a cell and light refracted by cellular components is used to create high-contrast, high-resolution images without staining. It is the oldest and simplest type of microscope that creates an image by altering the wavelengths of light rays passing through the specimen. Altered wavelength paths are created using an annular stop in the condenser. The annular stop produces a hollow cone of...
Atomic Absorption Spectroscopy: Interference01:25

Atomic Absorption Spectroscopy: Interference

Interference leads to systematic error in atomic absorption (AA) measurements by enhancing or diminishing the analytical signal or the background. These interferences can be grouped into three main categories: spectral interference, chemical interference, and physical interference.
Spectral interference occurs when signals from other elements or molecules overlap with the analyte signal, falsely elevating or masking the analyte's absorbance. This interference can be corrected using Zeeman,...
X-ray Crystallography02:18

X-ray Crystallography

The size of the unit cell and the arrangement of atoms in a crystal may be determined from measurements of the diffraction of X-rays by the crystal, termed X-ray crystallography.
Diffraction
Diffraction is the change in the direction of travel experienced by an electromagnetic wave when it encounters a physical barrier whose dimensions are comparable to those of the wavelength of the light. X-rays are electromagnetic radiation with wavelengths about as long as the distance between neighboring...
The de Broglie Wavelength02:32

The de Broglie Wavelength

In the macroscopic world, objects that are large enough to be seen by the naked eye follow the rules of classical physics. A billiard ball moving on a table will behave like a particle; it will continue traveling in a straight line unless it collides with another ball, or it is acted on by some other force, such as friction. The ball has a well-defined position and velocity or well-defined momentum, p = mv, which is defined by mass m and velocity v at any given moment. This is the typical...

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Related Experiment Video

Updated: Jun 26, 2026

Measurement of X-ray Beam Coherence along Multiple Directions Using 2-D Checkerboard Phase Grating
10:39

Measurement of X-ray Beam Coherence along Multiple Directions Using 2-D Checkerboard Phase Grating

Published on: October 11, 2016

Electron beam coherence measurements using diffracted beam interferometry/holography.

Rodney A Herring1

  • 1Center for Advanced Materials and Related Technology, Department of Mechanical Engineering, University of Victoria, Victoria, British Columbia, Canada. rherring@uvic.ca

Journal of Electron Microscopy
|January 15, 2009
PubMed
Summary
This summary is machine-generated.

Diffracted beam interferometry/holography reveals fringes in electron scattering, aiding crystal imaging contrast and measuring beam coherence. This technique offers insights into electron coherence and quasi-particle properties.

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Compact Lens-less Digital Holographic Microscope for MEMS Inspection and Characterization
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Compact Lens-less Digital Holographic Microscope for MEMS Inspection and Characterization

Published on: July 5, 2016

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Last Updated: Jun 26, 2026

Measurement of X-ray Beam Coherence along Multiple Directions Using 2-D Checkerboard Phase Grating
10:39

Measurement of X-ray Beam Coherence along Multiple Directions Using 2-D Checkerboard Phase Grating

Published on: October 11, 2016

Compact Lens-less Digital Holographic Microscope for MEMS Inspection and Characterization
10:28

Compact Lens-less Digital Holographic Microscope for MEMS Inspection and Characterization

Published on: July 5, 2016

Area of Science:

  • Electron microscopy
  • Solid-state physics
  • Quantum optics

Background:

  • Atomic resolution imaging in Transmission Electron Microscopy (TEM) and Annular Dark-Field Scanning Transmission Electron Microscopy (ADF-STEM) faces challenges with contrast mismatch between experimental and simulated images.
  • Understanding electron beam coherence is crucial for interpreting high-resolution microscopy data and exploring electron-matter interactions.

Purpose of the Study:

  • To investigate the intensity and coherence of elastically and inelastically scattered electrons using diffracted beam interferometry/holography (DBI/H).
  • To explore the utility of observed fringes in interferograms for improving contrast in atomic resolution imaging.
  • To demonstrate the potential of DBI/H for measuring electron beam lateral coherence and the coherence of energy loss quasi-particles.

Main Methods:

  • Utilized diffracted beam interferometry/holography (DBI/H) to study electron scattering.
  • Analyzed interferograms to observe fringe characteristics across various scattering angles.
  • Investigated the disappearance of fringes upon beam separation to quantify lateral coherence.

Main Results:

  • Observed persistent fringes in interferograms from low to high scattering angles.
  • Demonstrated that fringe intensity and coherence correlate with contrast in TEM and ADF-STEM imaging.
  • Quantified beam lateral coherence by measuring the separation at which fringes disappear.

Conclusions:

  • DBI/H is a valuable technique for studying electron beam coherence and its impact on imaging.
  • The observed fringes provide a method to understand and potentially mitigate contrast mismatches in high-resolution electron microscopy.
  • This approach shows promise for characterizing the coherence of quasi-particles associated with energy loss electrons.