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Implementation of a Reference Interferometer for Nanodetection
Published on: April 26, 2014
Picometer level displacement metrology with digitally enhanced heterodyne interferometry
Glenn de Vine1, David S Rabeling, Bram J J Slagmolen
1Centre for Gravitational Physics, College of Physical Sciences, The Australian National University, Canberra, ACT 0200, Australia.
Optics Express
|January 23, 2009
Summary
Digitally enhanced heterodyne interferometry achieves high displacement sensitivity, matching conventional methods for precision measurements. This laser metrology technique shows promise for advanced gravitational wave detectors.
Area of Science:
- Laser metrology
- Optical physics
- Gravitational wave detection
Background:
- Digitally enhanced heterodyne interferometry (DEHI) is an emerging laser metrology technique.
- It utilizes pseudo-random codes phase-modulated onto an optical carrier for precise measurements.
- Characterizing its displacement sensitivity is crucial for its application.
Purpose of the Study:
- To present the first characterization of DEHI's displacement sensitivity.
- To compare DEHI's performance against a conventional measurement technique.
- To assess DEHI's suitability for advanced gravitational wave detector applications.
Main Methods:
- Displacement of an optical cavity was measured using DEHI.
- Measurements were simultaneously compared to conventional Pound-Drever-Hall locking.
- A real-time signal extraction system on a field-programmable gate array (FPGA) was employed.
Main Results:
- DEHI displacement measurements agreed with Pound-Drever-Hall locking to within 5 pm/√Hz at 1 Hz.
- This agreement provides an upper bound for DEHI's displacement noise.
- The FPGA-based system demonstrated suitability for real-time control.
Conclusions:
- DEHI exhibits high displacement sensitivity, comparable to established methods.
- The technique is a viable option for lock acquisition in advanced gravitational wave detectors.
- Real-time signal processing on FPGAs enables practical implementation of DEHI.
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