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Updated: Jun 26, 2026

All-electronic Nanosecond-resolved Scanning Tunneling Microscopy: Facilitating the Investigation of Single Dopant Charge Dynamics
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All-electronic Nanosecond-resolved Scanning Tunneling Microscopy: Facilitating the Investigation of Single Dopant Charge Dynamics

Published on: January 19, 2018

Simple integrated single-atom detector

Marco Wilzbach1, Dennis Heine, Sönke Groth

  • 1Atominstitut der Osterreichischen Universitäten, TU-Wien, Vienna, Austria.

Optics Letters
|February 3, 2009
PubMed

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