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Updated: Jun 26, 2026

Single Plane Illumination Module and Micro-capillary Approach for a Wide-field Microscope
Published on: August 15, 2014
Investigation of the influence of the aberration induced by a plane interface on STED microscopy
1State Key Laboratory of High Field Laser Physics, Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences, Shanghai, China.
Abstract:
The structure of the inhibition patterns is important to the stimulated emission depletion (STED) microscopy. Usually, Laguerre- Gaussian (LG) beam and the central zero-intensity patterns created by inserting phase masks in Gaussian beams are used as the erase beam in STED microscopy. Aberration is generated when focusing beams through an interface between the media of the mismatched refractive indices. By use of the vectorial integral, the effects of such aberration on the shape of depletion patterns and the size of fluorescence emission spot in the STED microscopy are studied. Results are presented as a comparison between the aberration-free case and the aberrated cases.
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