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Updated: Jun 25, 2026

Subsurface Defect Localization by Structured Heating Using Laser Projected Photothermal Thermography
Published on: May 15, 2017
S H Goh1, C J R Sheppard, A C T Quah
1Centre for Integrated Circuit Failure Analysis and Reliability, National University of Singapore, Singapore. gohszuhuat@nus.edu.sg
This study optimizes refractive solid immersion lens (RSIL) performance for laser induced fault localization in integrated circuits. Key design parameters were identified, achieving 0.25 micrometer resolution and 15x signal enhancement for advanced failure analysis.
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