Search research articles

ABOUT JoVE

Overview Leadership Blog JoVE Help Center

AUTHORS

Publishing Process Editorial Board Scope & Policies Peer Review FAQ Submit

LIBRARIANS

Testimonials Subscriptions Access Resources Library Advisory Board FAQ

RESEARCH

JoVE Journal Methods Collections JoVE Encyclopedia of Experiments Archive

EDUCATION

JoVE Core JoVE Business JoVE Science Education JoVE Lab Manual Faculty Resource Center Faculty Site

Terms & Conditions of Use

Related Concept Videos

Atomic Force Microscopy

Atomic Force Microscopy

Atomic force microscopy (AFM) is a type of scanning probe microscopy that can analyze topographic details of various specimens like ceramics, glass, polymers, and biological samples. AFM offers over 1000 times more resolution than the optical imaging system. Images generated from AFM are three-dimensional surface profiles, offering an advantage over the flat, two-dimensional images from other imaging techniques.
The AFM Probe
The probe is regarded as the heart of any AFM setup and comprises the...

Scanning Electron Microscopy

Scanning Electron Microscopy

A scanning electron microscope (SEM) is used to study the surface features of a sample by using an electron beam that scans the sample surface in a two-dimensional manner. Typically, areas between ~1 centimeter to 5 micrometers in width can be imaged. SEM can be used to image bacteria, viruses, tissues as well as larger samples like insects. Conventional SEM gives a magnification ranging from 20X to 30,000X and spatial resolution of 50 to 100 nanometers.
Fundamental Principles
Accelerated...

Overview of Microscopy Techniques

Overview of Microscopy Techniques

The early pioneers of microscopy opened a window into the invisible world of microorganisms. In 1830, Joseph Jackson Lister created an essentially modern light microscope. The 20th century saw the development of microscopes that leveraged nonvisible light, such as fluorescence microscopy that uses an ultraviolet light source and electron microscopy that uses short-wavelength electron beams. These advances significantly improved magnification, image resolution, and contrast. By comparison, the...

You might also read

Related Articles

Articles linked to this work by shared authors, journal, and citation graph.

Sort by

Same author

Quantum paraelectric varactors for radiofrequency measurements at millikelvin temperatures.

Nature electronics·2024

Same author

Strong coupling between a microwave photon and a singlet-triplet qubit.

Nature communications·2024

Same author

Current practice in nutrition after allogeneic hematopoietic stem cell transplantation - Results from a survey among hematopoietic stem cell transplant centers.

Clinical nutrition (Edinburgh, Scotland)·2021

Same author

P-Band Induced Self-Organization and Dynamics with Repulsively Driven Ultracold Atoms in an Optical Cavity.

Physical review letters·2019

Same author

Direct band-gap crossover in epitaxial monolayer boron nitride.

Nature communications·2019

Same author

Responses to genotoxicity in mouse testicular germ cells and epididymal spermatozoa are affected by increased age.

Toxicology letters·2019

Search research articles

Related Experiment Video

Updated: Jun 25, 2026

Scanning-probe Single-electron Capacitance Spectroscopy

Scanning-probe Single-electron Capacitance Spectroscopy

Published on: July 30, 2013

Low-temperature and high magnetic field dynamic scanning capacitance microscope.

A Baumgartner¹, M E Suddards, C J Mellor

¹School of Physics and Astronomy, University of Nottingham, Nottingham NG7 2RD, United Kingdom. andreas.baumgartner@unibas.ch

The Review of Scientific Instruments

|February 5, 2009

Summary

This summary is machine-generated.

We developed a dynamic scanning capacitance microscope (DSCM) for high-bandwidth, cryogenic, and high-magnetic-field measurements. This advanced technique images electronic properties, revealing phenomena like compressible stripes in quantum Hall systems.

More Related Videos

Optimizing Magnetic Force Microscopy Resolution and Sensitivity to Visualize Nanoscale Magnetic Domains

Optimizing Magnetic Force Microscopy Resolution and Sensitivity to Visualize Nanoscale Magnetic Domains

Published on: July 20, 2022

Related Experiment Videos

Last Updated: Jun 25, 2026

Scanning-probe Single-electron Capacitance Spectroscopy

Scanning-probe Single-electron Capacitance Spectroscopy

Published on: July 30, 2013

Optimizing Magnetic Force Microscopy Resolution and Sensitivity to Visualize Nanoscale Magnetic Domains

Optimizing Magnetic Force Microscopy Resolution and Sensitivity to Visualize Nanoscale Magnetic Domains

Published on: July 20, 2022

Area of Science:

Surface science
Condensed matter physics
Nanotechnology

Background:

Atomic Force Microscopy (AFM) is a powerful tool for nanoscale imaging.
Measuring electronic properties at cryogenic temperatures and high magnetic fields presents significant challenges.

Purpose of the Study:

To introduce a novel Dynamic Scanning Capacitance Microscope (DSCM) capable of operating under extreme conditions.
To demonstrate the DSCM's ability to simultaneously measure topography, force, dissipation, and electronic properties.

Main Methods:

Utilizing a noncontact AFM with a quartz tuning fork sensor for excitation and readout.
Integrating the AFM tip into an RF resonator to probe tip-sample capacitance.
Developing a model to analyze resonator transmission and relate it to sample conductivity.

Main Results:

The DSCM successfully operated at large bandwidths, cryogenic temperatures, and high magnetic fields.
Images of metal disks under a polymer layer were obtained, demonstrating buried structure imaging.
Direct imaging of compressible stripes in a 2D electron gas under quantum Hall conditions was achieved.

Conclusions:

The DSCM is a versatile tool for nanoscale electronic property mapping under demanding conditions.
The technique provides new insights into electronic behavior in systems like 2D electron gases.
DSCM opens avenues for investigating complex electronic phenomena in condensed matter systems.