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Precision optical trapping via a programmable direct-digital-synthesis-based controller for acousto-optic deflectors.

A H Mack1, M K Trías, S G J Mochrie

  • 1Department of Applied Physics, Yale University, New Haven, Connecticut 06520, USA.

The Review of Scientific Instruments
|February 5, 2009
PubMed
Summary

Researchers developed a low-cost, programmable controller for acousto-optic deflectors. This device enables precise 1-nanometer step movements of microscopic beads, improving stability and functionality.

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Area of Science:

  • Optics and Photonics
  • Instrumentation and Measurement

Background:

  • Acousto-optic deflectors (AODs) are crucial for beam steering applications.
  • Existing controllers for AODs can be expensive and lack advanced functionality.
  • Nonlinear diffraction efficiency in AODs presents a challenge for precise control.

Purpose of the Study:

  • To develop a cost-effective, programmable controller for acousto-optic deflectors.
  • To address the nonlinear relationship between diffraction efficiency and angle in AODs.
  • To achieve highly stable and configurable beam steering with nanometer precision.

Main Methods:

  • Design and construction of a direct-digital-synthesis (DDS)-based controller.
  • Implementation of algorithms to correct for nonlinear diffraction efficiency.

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  • Integration of the controller with acousto-optic deflectors.

    • Main Results:

    • The developed controller offers superior stability, functionality, and configurability compared to commercial systems.
    • The system corrects for nonlinear diffraction efficiency versus diffraction angle.
    • Demonstrated precise movement of a 1 µm diameter bead in 1 nm steps, with these steps being resolvable.

    Conclusions:

    • The DDS-based controller provides a practical and affordable solution for advanced AOD control.
    • This technology enables unprecedented precision in manipulating microscopic objects.
    • The controller's design offers a significant advancement in optical instrumentation and metrology.