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Updated: Jun 25, 2026

Application of Atomic Force Microscopy to Detect Early Osteoarthritis
09:22

Application of Atomic Force Microscopy to Detect Early Osteoarthritis

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Applicability of AFM in cancer detection

M Lekka, P Laidler

    Nature Nanotechnology
    |February 7, 2009
    PubMed
    Abstract

    No abstract available in PubMed .

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    Atomic Force Microscopy

    Atomic force microscopy (AFM) is a type of scanning probe microscopy that can analyze topographic details of various specimens like ceramics, glass, polymers, and biological samples. AFM offers over 1000 times more resolution than the optical imaging system. Images generated from AFM are three-dimensional surface profiles, offering an advantage over the flat, two-dimensional images from other imaging techniques.
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