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Updated: Jun 25, 2026

Large-area Scanning Probe Nanolithography Facilitated by Automated Alignment and Its Application to Substrate Fabrication for Cell Culture Studies
Published on: June 12, 2018
You Wang1, Xiaodong Hong, Jun Zeng
1Department of Materials Physics and Chemistry, Harbin Institute of Technology, Harbin 150001, P. R. China. y-wang@hit.edu.cn
This study introduces a low-cost, high-speed nanolithography technique using a vibrating atomic force microscope (AFM) tip. This method creates precise patterns on polymer films, which can be easily erased and rewritten.
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