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Updated: Jun 25, 2026

Ohmic Contact Fabrication Using a Focused-ion Beam Technique and Electrical Characterization for Layer Semiconductor Nanostructures
08:12

Ohmic Contact Fabrication Using a Focused-ion Beam Technique and Electrical Characterization for Layer Semiconductor Nanostructures

Published on: December 5, 2015

Ambient air effects on electrical transport properties of ZnO nanorod transistors

Jae Young Park1, Ju-Jin Kim, Sang Sub Kim

  • 1School of Materials Science and Engineering, Inha University, Incheon 402-751, Korea.

Journal of Nanoscience and Nanotechnology
|February 10, 2009
PubMed

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