Jove
Visualize
Contact Us
JoVE
x logofacebook logolinkedin logoyoutube logo
ABOUT JoVE
OverviewLeadershipBlogJoVE Help Center
AUTHORS
Publishing ProcessEditorial BoardScope & PoliciesPeer ReviewFAQSubmit
LIBRARIANS
TestimonialsSubscriptionsAccessResourcesLibrary Advisory BoardFAQ
RESEARCH
JoVE JournalMethods CollectionsJoVE Encyclopedia of ExperimentsArchive
EDUCATION
JoVE CoreJoVE BusinessJoVE Science EducationJoVE Lab ManualFaculty Resource CenterFaculty Site
Terms & Conditions of Use
Privacy Policy
Policies

Related Concept Videos

Scanning Electron Microscopy01:07

Scanning Electron Microscopy

A scanning electron microscope (SEM) is used to study the surface features of a sample by using an electron beam that scans the sample surface in a two-dimensional manner. Typically, areas between ~1 centimeter to 5 micrometers in width can be imaged. SEM can be used to image bacteria, viruses, tissues as well as larger samples like insects. Conventional SEM gives a magnification ranging from 20X to 30,000X and spatial resolution of 50 to 100 nanometers.
Fundamental Principles
Accelerated...
Electron Microscope Tomography and Single-particle Reconstruction01:07

Electron Microscope Tomography and Single-particle Reconstruction

Transmission electron microscopy (TEM) can be used to determine the 3D structure of biological samples with the help of techniques such as electron microscope tomography and single-particle reconstruction. While single-particle reconstruction can examine macromolecules and macromolecular complexes in vitro conditions only, tomography permits the study of cell components or small cells in vivo.
Electron Tomography
Electron tomography can be performed either in TEM or STEM (scanning transmission...
Overview of Electron Microscopy01:25

Overview of Electron Microscopy

The wavelengths of visible light ultimately limit the maximum theoretical resolution of images created by light microscopes. Most light microscopes can only magnify 1000X, and a few can magnify up to 1500X. Electrons, like electromagnetic radiation, can behave like waves, but with wavelengths of 0.005 nm, they produce significantly greater resolution up to 0.05 nm as compared to 500 nm for visible light. An electron microscope (EM) can create a sharp image that is magnified up to 2,000,000X.

You might also read

Related Articles

Articles linked to this work by shared authors, journal, and citation graph.

Sort by
Same journal

Retracted: Diagnostic Efficacy of CT Radiomic Features in Pulmonary Invasive Mucinous Adenocarcinoma.

Scanning·2023
Same journal

Retracted: 3D Convolutional Neural Network Framework with Deep Learning for Nuclear Medicine.

Scanning·2023
Same journal

Retracted: Observation on the Effect of MRI Image Scanning on Knee Pain in Football Injury.

Scanning·2023
Same journal

Retracted: Optimal Cellular Microscopic Pattern Recognizer- (OCMPR-) Based Wireless Detection Network for Efficiently Leveraging the Parallel Distributed Processing Capabilities.

Scanning·2023
Same journal

Retracted: Changes of Volume Parameters in the Treatment of Graves Ophthalmopathy by Endoscopic Transethmoidal Decompression of the Orbital Inner Wall Combined with Fat Decompression.

Scanning·2023
Same journal

Retracted: Diagnostic Value of Specialist Systems in Sports Knee Injuries.

Scanning·2023

Related Experiment Video

Updated: Jun 25, 2026

Comprehensive Characterization of Extended Defects in Semiconductor Materials by a Scanning Electron Microscope
11:14

Comprehensive Characterization of Extended Defects in Semiconductor Materials by a Scanning Electron Microscope

Published on: May 28, 2016

Correcting for 3D distortion when using backscattered electron detectors in a scanning electron microscope.

Jacob M Proctor1

  • 1Ingrain Rocks, Inc., Houston, Texas, USA. Proctor@ingrainrocks.com

Scanning
|February 11, 2009
PubMed
Summary

Variable pressure scanning electron microscopy (VPSEM) images can be distorted. This study presents a procedure to adjust hardware and processing for accurate topographic surface relief imaging of samples like porous rock.

More Related Videos

Preparation and Observation of Thick Biological Samples by Scanning Transmission Electron Tomography
08:04

Preparation and Observation of Thick Biological Samples by Scanning Transmission Electron Tomography

Published on: March 12, 2017

Synchrotron X-ray Microdiffraction and Fluorescence Imaging of Mineral and Rock Samples
10:12

Synchrotron X-ray Microdiffraction and Fluorescence Imaging of Mineral and Rock Samples

Published on: June 19, 2018

Related Experiment Videos

Last Updated: Jun 25, 2026

Comprehensive Characterization of Extended Defects in Semiconductor Materials by a Scanning Electron Microscope
11:14

Comprehensive Characterization of Extended Defects in Semiconductor Materials by a Scanning Electron Microscope

Published on: May 28, 2016

Preparation and Observation of Thick Biological Samples by Scanning Transmission Electron Tomography
08:04

Preparation and Observation of Thick Biological Samples by Scanning Transmission Electron Tomography

Published on: March 12, 2017

Synchrotron X-ray Microdiffraction and Fluorescence Imaging of Mineral and Rock Samples
10:12

Synchrotron X-ray Microdiffraction and Fluorescence Imaging of Mineral and Rock Samples

Published on: June 19, 2018

Area of Science:

  • Materials Science
  • Geology
  • Microscopy

Background:

  • Variable pressure scanning electron microscopy (VPSEM) provides 2D images and topographic surface relief.
  • Topographic relief is valuable for analyzing porous rock structures, grain characteristics, and physical object dimensions.
  • Image accuracy depends heavily on hardware management, data acquisition, and postprocessing techniques.

Purpose of the Study:

  • To develop and verify a procedure for ensuring the accuracy of topographic surface relief images produced by VPSEM.
  • To address distortions observed in VPSEM imaging of both manufactured objects (ball bearing) and natural materials (Berea sandstone).

Main Methods:

  • Adjusting manufacturer-provided brightness and contrast settings.
  • Tuning backscatter detector plate amplifiers for equal output and zero voltage when idle.
  • Testing the procedure on a precision ball bearing and Berea sandstone samples.

Main Results:

  • The developed procedure successfully corrected distortions in VPSEM topographic surface relief imaging.
  • Verified accurate reproduction of physical dimensions for a ball bearing.
  • Corrected geometric tilting and topographic distortion in Berea sandstone images.

Conclusions:

  • The presented procedure enhances the veracity of VPSEM topographic surface relief imaging.
  • Accurate imaging is crucial for reliable analysis of material microstructures and physical properties.
  • This method improves the utility of VPSEM for scientific research involving detailed surface analysis.