Kinematic study of refraction properties of a ZnSe-ZnTe dielectric grating

The plane wave expansion method is applied to determine the thickness of the ZnSe-ZnTe slabs in a semi-infinite dielectric grating in such a way that the maximum reflectivity of the system is obtained. In this way the potential of the ZnSe-ZnTe system for applications in CdSe ultra thin quantum well based monolithic II-VI Vertical Cavity Surface Emitting Laser for the green spectral region is demonstrated. A kinematic analysis of the thickness-dependent refraction at the boundary between a ZnSe-ZnTe semi-infinite one dimensional photonic crystal and a homogeneous material in transverse magnetic polarization and oblique incidence case is presented.