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Multimodal Analytical Platform on a Multiplexed Surface Plasmon Resonance Imaging Chip for the Analysis of Extracellular Vesicle Subsets
Published on: March 17, 2023
Electrically addressable vesicles: tools for dielectrophoresis metrology
Salil P Desai1, Michael D Vahey, Joel Voldman
1Department of Electrical Engineering and Computer Science, Massachusetts Institute of Technology, Cambridge, Massachusetts 02139, USA.
Langmuir : the ACS Journal of Surfaces and Colloids
|February 21, 2009
Summary
Researchers developed electrically addressable vesicles (EAVs) for precise manipulation of bioparticles using dielectrophoresis (DEP). These engineered EAVs allow for distinct electrical responses, paving the way for advanced metrology tools in microfluidic systems.
Area of Science:
- Biophysics
- Microfluidics
- Materials Science
Background:
- Dielectrophoresis (DEP) is a key technique for manipulating micro- and nanoparticles.
- Existing methods lack precise control over particle electrical properties for tailored responses.
Purpose of the Study:
- To develop novel test particles with engineered electrical properties for DEP applications.
- To create electrically addressable vesicles (EAVs) for controlled dielectrophoretic manipulation.
Main Methods:
- Utilized phospholipid vesicle electroformation techniques.
- Engineered EAVs by controlling internal electrolyte strength and incorporating functionalized phospholipids with PEG brushes.
- Investigated electrical polarizability and fluorescence signatures for particle characterization.
Main Results:
- Demonstrated successful creation of EAVs with tunable electrical properties.
- Showcased control over vesicle electrical polarizability through internal and membrane modifications.
- Established a method to encode vesicle properties in their fluorescence signature.
Conclusions:
- EAVs provide a new platform for creating distinct particle populations for DEP.
- This technology enables precise control over particle manipulation in microfabricated systems.
- EAVs represent a foundational step towards developing metrology tools for DEP-based microsystems.

