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Electrochemical Etching and Characterization of Sharp Field Emission Points for Electron Impact Ionization
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Published on: July 12, 2016

Field enhancement factor and field emission from a hemi-ellipsoidal metallic needle

Evgeny G Pogorelov1, Alexander I Zhbanov, Yia-Chung Chang

  • 1Research Center for Applied Sciences, Academia Sinica, 128, Section 2, Academia Road Nankang, Taipei 115, Taiwan.

Ultramicroscopy
|February 24, 2009
PubMed

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