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Updated: Jun 25, 2026

Single Particle Cryo-Electron Microscopy: From Sample to Structure
Published on: May 29, 2021
Sjors H W Scheres1, Mikel Valle, Patricia Grob
1Centro Nacional de Biotecnología-CSIC, Calle Darwin 3, Campus Universidad Autonoma, Cantoblanco, 28049 Madrid, Spain. scheres@cnb.csic.es
This study introduces a new statistical data model to address normalization errors in cryo-electron microscopy (cryo-EM) image analysis. The improved model successfully classifies structurally heterogeneous data, revealing new conformations missed by conventional methods.
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