Relative Quantification of Cellular Sections with Molecular Depth Profiling ToF-SIMS Imaging

M E Kurczy1, Joseph Kozole, S A Parry

  • 1Department of Chemistry, Penn State University, 104 Chemistry Building, University Park, PA 16802.

Applied Surface Science
|February 28, 2009
PubMed
Summary

Secondary ion mass spectrometry (SIMS) imaging quantifies lipid differences between cell membranes and cytoplasm. This method enables comparative lipid analysis in treated versus control cells using lipophilic dyes for depth profiling.