Application of electron backscatter diffraction to the study of phase transformations: present and possible future

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Quantitative Atomic-Site Analysis of Functional Dopants/Point Defects in Crystalline Materials by Electron-Channeling-Enhanced Microanalysis
07:24

Quantitative Atomic-Site Analysis of Functional Dopants/Point Defects in Crystalline Materials by Electron-Channeling-Enhanced Microanalysis

Published on: May 10, 2021

A-F Gourgues-Lorenzon1

  • 1MINES ParisTech, Centre des Matériaux, CNRS UMR 7633, B.P. 87, 91003 Evry cedex, France. anne-francoise.gourgues@ensmp.fr

Journal of Microscopy
|March 3, 2009
PubMed

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