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Updated: Jun 25, 2026

All-electronic Nanosecond-resolved Scanning Tunneling Microscopy: Facilitating the Investigation of Single Dopant Charge Dynamics
11:33

All-electronic Nanosecond-resolved Scanning Tunneling Microscopy: Facilitating the Investigation of Single Dopant Charge Dynamics

Published on: January 19, 2018

Influence of a dielectric layer on photon emission induced by a scanning tunneling microscope

X Tao1, Z C Dong, J L Yang

  • 1Hefei National Laboratory for Physical Sciences at the Microscale, University of Science and Technology of China, Hefei, Anhui 230026, China.

The Journal of Chemical Physics
|March 5, 2009
PubMed

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