Jove
Visualize
Contact Us
JoVE
x logofacebook logolinkedin logoyoutube logo
ABOUT JoVE
OverviewLeadershipBlogJoVE Help Center
AUTHORS
Publishing ProcessEditorial BoardScope & PoliciesPeer ReviewFAQSubmit
LIBRARIANS
TestimonialsSubscriptionsAccessResourcesLibrary Advisory BoardFAQ
RESEARCH
JoVE JournalMethods CollectionsJoVE Encyclopedia of ExperimentsArchive
EDUCATION
JoVE CoreJoVE BusinessJoVE Science EducationJoVE Lab ManualFaculty Resource CenterFaculty Site
Terms & Conditions of Use
Privacy Policy
Policies

Related Concept Videos

Atomic Force Microscopy01:08

Atomic Force Microscopy

Atomic force microscopy (AFM) is a type of scanning probe microscopy that can analyze topographic details of various specimens like ceramics, glass, polymers, and biological samples. AFM offers over 1000 times more resolution than the optical imaging system. Images generated from AFM are three-dimensional surface profiles, offering an advantage over the flat, two-dimensional images from other imaging techniques.
The AFM Probe
The probe is regarded as the heart of any AFM setup and comprises the...

You might also read

Related Articles

Articles linked to this work by shared authors, journal, and citation graph.

Sort by
Same author

From seals to survival: "India's Cinderella stamp advocacy in the global tuberculosis eradication movement: A visual and historical examination".

The Indian journal of tuberculosis·2026
Same author

Non-invasive biomechanical characterization of embryos using microfluidic cantilevers.

European biophysics journal : EBJ·2026
Same author

DNDC modelling of greenhouse gas exchange from a boreal legume grassland under organic and mineral nitrogen management.

Journal of environmental management·2025
Same author

Preliminary Insights into the Acute Molecular Responses in C2C12 Myotubes to Hyperthermia and Insulin Treatment.

bioRxiv : the preprint server for biology·2025
Same author

Scope 2 estimates of carbon dioxide emissions from electricity consumption at the US census block group scale.

Scientific data·2024
Same author

Design, fabrication, and calibration of a micromachined thermocouple for biological applications in temperature monitoring.

Biosensors & bioelectronics·2024

Related Experiment Video

Updated: Jun 25, 2026

Active Probe Atomic Force Microscopy with Quattro-Parallel Cantilever Arrays for High-Throughput Large-Scale Sample Inspection
05:04

Active Probe Atomic Force Microscopy with Quattro-Parallel Cantilever Arrays for High-Throughput Large-Scale Sample Inspection

Published on: June 13, 2023

Thermally actuated tapping mode atomic force microscopy with polymer microcantilevers.

Bhaskar Mitra1, Angelo Gaitas

  • 1PicoCal Inc., Ann Arbor, Michigan 48103, USA.

The Review of Scientific Instruments
|March 5, 2009
PubMed
Summary

This study presents a novel atomic force microscopy (AFM) using a polymer cantilever with a built-in heater for thermal actuation. This method enables sample imaging without optomechanical feedback, achieving high resolution.

More Related Videos

Atomic Force Microscopy of Red-Light Photoreceptors Using PeakForce Quantitative Nanomechanical Property Mapping
14:13

Atomic Force Microscopy of Red-Light Photoreceptors Using PeakForce Quantitative Nanomechanical Property Mapping

Published on: October 24, 2014

Atomic Force Microscopy Cantilever-Based Nanoindentation: Mechanical Property Measurements at the Nanoscale in Air and Fluid
08:58

Atomic Force Microscopy Cantilever-Based Nanoindentation: Mechanical Property Measurements at the Nanoscale in Air and Fluid

Published on: December 2, 2022

Related Experiment Videos

Last Updated: Jun 25, 2026

Active Probe Atomic Force Microscopy with Quattro-Parallel Cantilever Arrays for High-Throughput Large-Scale Sample Inspection
05:04

Active Probe Atomic Force Microscopy with Quattro-Parallel Cantilever Arrays for High-Throughput Large-Scale Sample Inspection

Published on: June 13, 2023

Atomic Force Microscopy of Red-Light Photoreceptors Using PeakForce Quantitative Nanomechanical Property Mapping
14:13

Atomic Force Microscopy of Red-Light Photoreceptors Using PeakForce Quantitative Nanomechanical Property Mapping

Published on: October 24, 2014

Atomic Force Microscopy Cantilever-Based Nanoindentation: Mechanical Property Measurements at the Nanoscale in Air and Fluid
08:58

Atomic Force Microscopy Cantilever-Based Nanoindentation: Mechanical Property Measurements at the Nanoscale in Air and Fluid

Published on: December 2, 2022

Area of Science:

  • Materials Science
  • Nanotechnology
  • Surface Science

Background:

  • Atomic Force Microscopy (AFM) is a powerful tool for nanoscale imaging.
  • Traditional AFM often relies on complex optomechanical feedback systems.
  • Developing simpler, more robust AFM actuation methods is desirable.

Purpose of the Study:

  • To demonstrate a thermally actuated tapping mode AFM using a polymer cantilever.
  • To investigate the performance and resolution of this novel AFM system.
  • To explore imaging capabilities without conventional optomechanical feedback.

Main Methods:

  • Fabrication of a polyimide cantilever (350x250x3 µm³) with an embedded resistive heater.
  • Utilizing periodic AC excitation of the heater for thermal actuation and cantilever oscillation.
  • Employing tip-sample interaction damping for imaging without optomechanical feedback.

Main Results:

  • Achieved cantilever oscillation (5-10 nm amplitude) due to thermal stress gradients.
  • Observed oscillation at 2ω, linearly dependent on applied voltage.
  • Demonstrated imaging resolution comparable to contact mode AFM using a 200 nm grating.

Conclusions:

  • Thermally actuated polymer cantilevers offer a viable alternative for AFM.
  • This approach simplifies AFM systems by eliminating the need for optomechanical feedback.
  • The demonstrated resolution highlights the potential of this technique for nanoscale surface analysis.