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Updated: Jun 25, 2026

Polarization-Sensitive Two-Photon Microscopy for a Label-Free Amyloid Structural Characterization
Published on: September 8, 2023
Observation of polarization singularities at the nanoscale
M Burresi1, R J P Engelen, A Opheij
1Center for Nanophotonics, FOM Institute for Atomic and Molecular Physics (AMOLF), Kruislaan 407, 1098 SJ Amsterdam, The Netherlands. burresi@amolf.nl
Abstract:
With a phase-sensitive near-field microscope we measure independently the two in-plane electric field components of light propagating through a 2D photonic crystal waveguide and the phase difference between them. Consequently, we are able to reconstruct the electric vector field distribution with subwavelength resolution. In the complex field distribution we observe both time-dependent and time-independent polarization singularities and determine the topology of the surrounding electric field.
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