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Updated: Jun 25, 2026

Carrier Lifetime Measurements in Semiconductors through the Microwave Photoconductivity Decay Method
Published on: April 18, 2019
Temperature dependence of microwave photoresistance in 2D electron systems
A T Hatke1, M A Zudov, L N Pfeiffer
1School of Physics and Astronomy, University of Minnesota, Minneapolis, Minnesota 55455, USA.
Abstract:
We report on the temperature dependence of microwave-induced resistance oscillations in high-mobility two-dimensional electron systems. We find that the oscillation amplitude decays exponentially with increasing temperature, as exp(-alphaT;{2}), where alpha scales with the inverse magnetic field. This observation indicates that the temperature dependence originates primarily from the modification of the single particle lifetime, which we attribute to electron-electron interaction effects.
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