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Published on: January 28, 2019
Force mapping of an extended light pattern in an inclined plane: deterministic regime
Alejandro V Arzola1, Karen Volke-Sepúlveda, José L Mateos
1Instituto de Física, Universidad Nacional Autonoma de México Apdo. Postal 20-364, 01000 México Distrito Federal, México.
We mapped non-linear optical trapping forces using microscopic beads in an inclined plane. This method quantifies forces in interference patterns, showing good agreement with a ray optics model.
Area of Science:
- Optics and Photonics
- Soft Matter Physics
- Nanotechnology
Background:
- Non-linear optical forces are crucial for manipulating microscopic particles.
- Understanding these forces in interference patterns requires precise experimental mapping.
- Previous studies often simplified the force interactions or experimental conditions.
Purpose of the Study:
- To quantitatively map the non-linear optical trapping force within an extended interference pattern.
- To investigate the influence of particle size and fringe spatial period on optical forces.
- To validate experimental findings with a theoretical ray optics model.
Main Methods:
- Studied the dynamics of 8, 10, and 14.5-micron spherical beads in an overdamped system.
- Utilized a novel experimental setup involving a tilted sample cell to create a deterministic washboard potential.
- Analyzed particle movement under the combined influence of optical forces and gravity.
Main Results:
- Successfully mapped the non-linear optical trapping force as a function of position.
- Observed good quantitative agreement between experimental data and the ray optics model.
- Demonstrated the force mapping across various microsphere sizes and fringe spatial periods.
Conclusions:
- The experimental approach provides a reliable method for quantifying optical trapping forces in interference patterns.
- The ray optics model accurately predicts the observed forces for the studied particle sizes.
- This work advances the understanding of light-matter interactions in structured optical fields.
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