Related Experiment Video

Updated: Jun 25, 2026

3D Depth Profile Reconstruction of Segregated Impurities Using Secondary Ion Mass Spectrometry
07:10

3D Depth Profile Reconstruction of Segregated Impurities Using Secondary Ion Mass Spectrometry

Published on: April 29, 2020

A model of secondary electron imaging in the helium ion scanning microscope

Ranjan Ramachandra1, Brendan Griffin, David Joy

  • 1University of Tennessee, Knoxville, TN 37996, USA.

Ultramicroscopy
|March 10, 2009
PubMed

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