Related Experiment Video
Updated: Jun 25, 2026

Digital Inline Holographic Microscopy (DIHM) of Weakly-scattering Subjects
Published on: February 8, 2014
Fast computation of constructive and destructive interference areas in partially coherent imaging for resolution
Kenji Yamazoe1, Yoshiyuki Sekine, Tokuyuki Honda
1Department of Electrical Engineering and Computer Science,University of California, Berkeley, 231 Cory Hall, Berkeley, California 94720-1770, USA. kenjiy@eecs.berkeley.edu
Abstract:
We present a method to determine constructive and destructive interference areas on the object plane in partially coherent imaging. This method is based on the interference pattern on the image plane. A function Gamma that shows constructive and destructive interference areas with respect to the origin on the object plane is derived as the product of mutual intensity on the object plane and the Fourier transform of the pupil function. The convolution integral of Gamma and object transmittance gives the constructive and destructive interference areas. Experimental results show that small clear openings placed at constructive interference areas enhance light intensity at desired positions. By applying this method to optical microlithography imaging, one can achieve resolution enhancement of fine features with a relatively small amount of computation.
More Related Videos
Related Concept Videos
Interference and Diffraction
Phase Contrast and Differential Interference Contrast Microscopy
In-phase-contrast microscopes, interference between light directly passing through a cell and light refracted by cellular components is used to create high-contrast, high-resolution images without staining. It is the oldest and simplest type of microscope that creates an image by altering the wavelengths of light rays passing through the specimen. Altered wavelength paths are created using an annular stop in the condenser. The annular stop produces a hollow cone of...
Super-resolution Fluorescence Microscopy

