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Updated: Jun 24, 2026

Quantitative Atomic-Site Analysis of Functional Dopants/Point Defects in Crystalline Materials by Electron-Channeling-Enhanced Microanalysis
Published on: May 10, 2021
Frederick Meisenkothen1, Robert Wheeler, Michael D Uchic
1Air Force Research Laboratory, Materials Characterization Facility, Wright Patterson Air Force Base, OH 45433, USA. frederick.meisenkothen@wpafb.af.mil
Electron channeling significantly impacts X-ray signals in bulk materials at low overvoltages. This effect, often overlooked, can cause up to 26% intensity variations, affecting microanalysis accuracy.
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