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Updated: Jun 24, 2026

Implementation of a Reference Interferometer for Nanodetection
Published on: April 26, 2014
Alexander C Ruege1, Ronald M Reano
1Electroscience Laboratory, Department of Electrical and Computer Engineering, The Ohio State University, Columbus, OH 43212, USA.
This study introduces a novel sensor platform using fringe visibility detection for highly sensitive measurements. The new method shows an 8.2x greater response to changes in analyte refractive index compared to traditional transmission methods.
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