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Updated: Jun 24, 2026

High-Throughput Total Internal Reflection Fluorescence and Direct Stochastic Optical Reconstruction Microscopy Using a Photonic Chip

High-Throughput Total Internal Reflection Fluorescence and Direct Stochastic Optical Reconstruction Microscopy Using a Photonic Chip

Published on: November 16, 2019

High-speed optical sampling using a silicon-chip temporal magnifier.

Reza Salem¹, Mark A Foster, Amy C Turner-Foster

¹School of Applied and Engineering Physics, Cornell University, Ithaca, NY 14853, USA. reza.salem@cornell.edu

|March 19, 2009

Summary

This summary is machine-generated.

We developed a novel optical sampling method using a silicon chip time lens for high-speed waveform analysis. This technique achieves unprecedented temporal magnification, enabling faster data capture and performance monitoring.

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Area of Science:

Photonics and Optical Engineering
Materials Science
Electrical Engineering

Background:

Ultrafast optical signal analysis is crucial for high-speed communications and scientific research.
Existing sampling techniques face limitations in speed and resolution.
Silicon photonics offers a scalable platform for advanced optical functionalities.

Purpose of the Study:

To demonstrate a single-shot optical sampling technique with high temporal magnification.
To achieve real-time sampling of ultrafast waveforms at terasample-per-second rates.
To enable high-speed performance monitoring for advanced communication systems.

Main Methods:

Utilized a silicon-chip time lens to achieve significant temporal magnification.
Implemented a single-shot optical sampling scheme for capturing transient events.
Applied the technique for sampling ultrafast waveforms and monitoring 80-Gb/s signals.

Main Results:

Achieved the largest reported temporal magnification factor (>500).
Successfully performed single-shot sampling of ultrafast waveforms at 1.3 TS/s.
Demonstrated 80-Gb/s performance monitoring capabilities.

Conclusions:

The developed silicon-chip time lens technique enables unprecedented single-shot optical sampling speeds.
This method has the potential to upgrade GHz oscilloscopes to THz bandwidth measurement instruments.
Offers a promising pathway for advancing high-speed optical signal characterization and testing.