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Scanning Electron Microscopy (SEM) Protocols for Problematic Plant, Oomycete, and Fungal Samples
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Scanning electron microscopy of perineal patterns of three species of Meloidogyne

C P Yik1, W Birchfield

  • 1Department of Plant Pathology, Louisiana State University, Baton Rouge, LA 70803, USA.

Journal of Nematology
|March 24, 2009
PubMed

Keywords:
Meloidoffyne incogaitaMeloidogyne graminicolaMeloidogyne haplacuticular striaepunctations

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Scanning Electron Microscopy01:07

Scanning Electron Microscopy

A scanning electron microscope (SEM) is used to study the surface features of a sample by using an electron beam that scans the sample surface in a two-dimensional manner. Typically, areas between ~1 centimeter to 5 micrometers in width can be imaged. SEM can be used to image bacteria, viruses, tissues as well as larger samples like insects. Conventional SEM gives a magnification ranging from 20X to 30,000X and spatial resolution of 50 to 100 nanometers.
Fundamental Principles
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