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Updated: Jun 24, 2026

Fabrication of a Dipole-assisted Solid Phase Extraction Microchip for Trace Metal Analysis in Water Samples
Published on: August 7, 2016
Near-edge X-ray absorption fine-structure microscopy of organic and magnetic materials
1Department of Physics, NCSU, Raleigh, North Carolina 27695, USA. Harald_Ade@ncsu.edu
Abstract:
Many high-performance materials and novel devices consist of multiple components and are naturally or intentionally nano-structured for optimal properties and performance. To understand their structure-property relationships fully, quantitative compositional analysis at length scales below 100 nm is required, a need that is often uniquely addressed using soft X-ray microscopy. Similarly, the interaction of X-rays with magnetic materials provides unique element-specific contrast that allows the determination of magnetic properties in multi-element antiferromagnetic and ferromagnetic materials. Pump-probe-type experiments can even investigate magnetic domain dynamics. Here we review and exemplify the ability of soft X-ray microscopy to provide information that is otherwise inaccessible, and discuss a perspective on future developments.
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