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Atomic Force Microscopy

Atomic Force Microscopy

Atomic force microscopy (AFM) is a type of scanning probe microscopy that can analyze topographic details of various specimens like ceramics, glass, polymers, and biological samples. AFM offers over 1000 times more resolution than the optical imaging system. Images generated from AFM are three-dimensional surface profiles, offering an advantage over the flat, two-dimensional images from other imaging techniques.
The AFM Probe
The probe is regarded as the heart of any AFM setup and comprises the...

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Frictional Force

When a body is in motion, it encounters resistance because the body interacts with its surroundings. This resistance is known as friction, a common yet complex force whose behavior is still not completely understood. Friction opposes relative motion between systems in contact, but also allows us to move. Friction arises in part due to the roughness of surfaces in contact. For one object to move along a surface, it must rise to where the peaks of the surface can skip along the bottom of the...

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Related Experiment Video

Updated: Jun 24, 2026

Quantitative Hardness Measurement by Instrumented AFM-indentation

Quantitative Hardness Measurement by Instrumented AFM-indentation

Published on: November 22, 2016

Quantitative friction-force measurements by longitudinal atomic force microscope imaging.

Eric Karhu¹, Mark Gooyers, Jeffrey L Hutter

¹Department of Physics and Astronomy, The University of Western Ontario, London, Ontario N6A 3K7, Canada.

Langmuir : the ACS Journal of Surfaces and Colloids

|April 2, 2009

Summary

Quantitative friction force measurements are now possible using longitudinal atomic force microscopy (AFM) imaging. This method offers advantages over lateral force imaging, simplifying calibration and probe analysis.

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Area of Science:

Surface science
Nanotechnology
Materials science

Background:

Atomic Force Microscopy (AFM) is crucial for nanoscale surface analysis.
Quantitative friction force measurements are hindered by challenges in probe torsional response.
Lateral force microscopy (LFM) is standard but has limitations.

Purpose of the Study:

To demonstrate the feasibility of quantitative friction force measurements using longitudinal AFM imaging.
To highlight the advantages of longitudinal imaging over traditional lateral force imaging.
To present a simplified calibration method for friction force measurements.

Main Methods:

Utilizing the longitudinal scanning mode of AFM for friction measurements.
Comparing results with traditional lateral force imaging.
Developing a calibration technique using sequential longitudinal and lateral imaging.

Main Results:

Longitudinal AFM imaging enables quantitative friction force measurements.
Topology and friction are coupled predictably in longitudinal mode.
Eliminates the need to determine the torsional spring constant.
Facilitates convenient calibration without extra equipment or sample preparation.

Conclusions:

Longitudinal AFM imaging is a viable and advantageous method for quantitative friction measurements.
This approach simplifies calibration and probe characterization.
It offers a more direct coupling of topography and friction data.