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Active Probe Atomic Force Microscopy with Quattro-Parallel Cantilever Arrays for High-Throughput Large-Scale Sample Inspection
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Active Probe Atomic Force Microscopy with Quattro-Parallel Cantilever Arrays for High-Throughput Large-Scale Sample Inspection

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Capture and release of traveling intrinsic localized mode in coupled cantilever array

Masayuki Kimura1, Takashi Hikihara

  • 1Department of Electrical Engineering, Kyoto University, Kyoto, Japan. kimura@dove.kuee.kyoto-u.ac.jp

Chaos (Woodbury, N.Y.)
|April 2, 2009
PubMed

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