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Cooling Rate Dependent Ellipsometry Measurements to Determine the Dynamics of Thin Glassy Films
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Published on: January 26, 2016

Generalized ellipsometry for monoclinic absorbing materials: determination of optical constants of Cr columnar thin

D Schmidt1, B Booso, T Hofmann

  • 1Department of Electrical Engineering and Nebraska Center for Materials and Nanoscience, University of Nebraska-Lincoln, Lincoln, NE 68588, USA. schmidt@huskers.unl.edu

Optics Letters
|April 3, 2009
PubMed

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