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Updated: Jun 24, 2026

Micro/Nano-scale Strain Distribution Measurement from Sampling Moiré Fringes

Micro/Nano-scale Strain Distribution Measurement from Sampling Moiré Fringes

Published on: May 23, 2017

Theoretical analysis for moiré deflectometry from diffraction theory.

Yang Song¹, Yun Yun Chen, Anzhi He

¹Department of Information Physics and Engineering, Nanking University of Science and Technology, Nanking 210094 China. sy0204@vip.sina.com

Journal of the Optical Society of America. A, Optics, Image Science, and Vision

|April 3, 2009

Summary

This summary is machine-generated.

Moiré deflectometry is explained by diffraction theory, revealing it as multishearing interference, not just geometry. This provides a more precise method for analyzing deflection angles using moiré patterns.

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Area of Science:

Optics and Photonics
Diffraction Theory
Interferometry

Background:

Moiré deflectometry is a technique used for measuring small deflections.
Previous theories often treated the moiré effect as a purely geometric phenomenon.

Purpose of the Study:

To present a theoretical framework for moiré deflectometry based on scalar diffraction theory.
To clarify the physical nature of the moiré effect in deflectometry.

Main Methods:

Application of scalar diffraction theory to moiré deflectometry.
Analysis of moiré patterns under zeroth-order and first-order filtering conditions.
Investigation of the role of diffraction and grating separation on moiré fringes.

Main Results:

The moiré effect is demonstrated to be a result of multishearing interference.
Zeroth-order filtering yields double-shearing interference, while first-order filtering results in triple-shearing interference.
First-order filtering produces a cosinusoidal intensity distribution, with diffraction affecting only the phase shift.

Conclusions:

A more precise relationship between unwrapped phase and deflection angles is established.
The findings enhance the understanding and application of moiré patterns in Fourier transform profilometry and phase-shift methods.