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Published on: June 28, 2018
Polarization dependence of Z-scan measurement: theory and experiment
Xiao-Qing Yan1, Zhi-Bo Liu, Xiao-Liang Zhang
1The Key Laboratory of Weak Light Nonlinear Photonics, Ministry of Education, Teda Applied Physics School, Nankai University, Tianjin 300457, China.
Abstract:
Here we report on an extension of common Z-scan method to arbitrary polarized incidence light for measurements of anisotropic third-order nonlinear susceptibility in isotropic medium. The normalized transmittance formulas of closed-aperture Z-scan are obtained for linearly, elliptically and circularly polarized incidence beam. The theoretical analysis is examined experimentally by studying third-order nonlinear susceptibility of CS2 liquid. Results show that the elliptically polarized light Z-scan method can be used to measure simultaneously the two third-order nonlinear susceptibility components chi(3)(xyyx) and chi(3)(xxyy). Furthermore, the elliptically polarized light Z-scan measurements of large nonlinear phase shift are also analyzed theoretically and experimentally.
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