Physical properties of oriented thin films formed by the electrostatic complexation of sulfonated polyaramid

Hayley A Every1, Leen V van der Ham, Stephen J Picken

  • 1Section NanoStructure Materials, Delft Chemical Technology, Delft University of Technology, Julianalaan 136, 2628BL Delft, The Netherlands. H.A.Every@tudelft.nl