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Related Experiment Video

Updated: Jun 24, 2026

Implementation of a Reference Interferometer for Nanodetection

Implementation of a Reference Interferometer for Nanodetection

Published on: April 26, 2014

Random phase-shifting interferometry without accurately controlling or calibrating the phase shifts.

Qun Hao¹, Qiudong Zhu, Yao Hu

¹Opto-Electronic College, Beijing Institute of Technology, Beijing 100081, China. qhao@bit.edu.cn

|April 17, 2009

Summary

A novel random phase-shifting interferometry method eliminates environmental noise. This technique uses random and active phase shifts to accurately measure phase, making it robust for various applications.

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Area of Science:

Optical Metrology
Interferometry
Environmental Noise Reduction

Background:

Traditional phase-shifting interferometry is sensitive to environmental disturbances.
Accurate calibration of phase shifts is often required, complicating setups.

Purpose of the Study:

To propose a random phase-shifting interferometry technique robust against environmental noise.
To develop a phase-solving algorithm independent of precise phase shift step length.

Main Methods:

Utilizing random passive phase shifts induced by environmental noise for intensity ergodicity.
Employing supplementary active phase shifts to accelerate the measurement cycle.
Analyzing temporal intensity extrema at each pixel for phase retrieval.
Averaging statistically uncorrelated data over extended periods to minimize random errors.

Main Results:

Demonstrated a phase-shifting interferometry method insensitive to environmental noise.
Successfully retrieved phase information without needing to know the exact phase shift step length.
Validated the technique using a miniature Fizeau interferometer.

Conclusions:

The proposed random phase-shifting interferometry offers a noise-insensitive and practical approach for optical measurements.
This method simplifies experimental requirements by not needing precise phase shift calibration.
Feasibility confirmed, paving the way for robust interferometric measurements in noisy environments.