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Resonant activation through effective temperature oscillation in a Josephson tunnel junction
Cheng Pan1, Xinsheng Tan, Yang Yu
1Department of Physics and National Laboratory of Solid State Microstructures, Nanjing University, Nanjing 210093, China.
Summary
We found that oscillating temperature can cause resonant activation in Josephson tunnel junctions. This phenomenon, resonant escape, shows a minimum average escape time at specific oscillation frequencies.
Area of Science:
- Quantum physics
- Condensed matter physics
Background:
- Josephson tunnel junctions are crucial in quantum electronics.
- Understanding thermal escape from metastable states is key for device stability.
Purpose of the Study:
- To experimentally investigate thermal escape dynamics in Josephson junctions.
- To explore the effect of oscillating effective temperature on escape time.
- To confirm resonant activation driven by temperature oscillations.
Main Methods:
- Experimental setup involving a Josephson tunnel junction.
- Subjecting the junction to an oscillating effective temperature.
- Measuring average escape time as a function of oscillation frequency.
Main Results:
- Observed a minimum in average escape time at specific oscillation frequencies.
- Confirmed that resonant activation can be induced by oscillating temperature.
- Demonstrated a linear dependence of minimum escape time on resonant frequency.
Conclusions:
- Resonant activation is achievable through oscillating temperature, not just oscillating barriers.
- The observed resonant escape is linked to the correlation between oscillation and the escape process.
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