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Updated: Jun 23, 2026

Fabrication of Gate-tunable Graphene Devices for Scanning Tunneling Microscopy Studies with Coulomb Impurities
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Fabrication of Gate-tunable Graphene Devices for Scanning Tunneling Microscopy Studies with Coulomb Impurities

Published on: July 24, 2015

Comment on "Near-edge X-ray absorption fine-structure investigation of graphene"

H-K Jeong, H-J Noh, J-Y Kim

    Physical Review Letters
    |April 28, 2009
    PubMed

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