An improved dynamic model of tuning fork probe for scanning probe microscopy

B P Ng1, Y Zhang, S W Kok

  • 1Singapore Institute of Manufacturing Technology, 71 Nanyang Avenue, Singapore 638075, Singapore.

Journal of Microscopy
|April 29, 2009
PubMed
Summary

A new two coupled oscillators model accurately describes tuning fork probe dynamics. This enhanced model improves force sensing sensitivity and noise performance analysis for scientific instruments.