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Updated: Jun 23, 2026

Active Probe Atomic Force Microscopy with Quattro-Parallel Cantilever Arrays for High-Throughput Large-Scale Sample Inspection
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Active Probe Atomic Force Microscopy with Quattro-Parallel Cantilever Arrays for High-Throughput Large-Scale Sample Inspection

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An improved dynamic model of tuning fork probe for scanning probe microscopy

B P Ng1, Y Zhang, S W Kok

  • 1Singapore Institute of Manufacturing Technology, 71 Nanyang Avenue, Singapore 638075, Singapore.

Journal of Microscopy
|April 29, 2009
PubMed

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