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Angle-resolved Photoemission Spectroscopy At Ultra-low Temperatures
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Determination of the electron escape depth for NEXAFS spectroscopy

K E Sohn1, M D Dimitriou, J Genzer

  • 1Department of Materials, University of California Santa Barbara, Santa Barbara, California 93106, USA.

Langmuir : the ACS Journal of Surfaces and Colloids
|April 30, 2009
PubMed

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