Jove
Visualize
Contact Us
JoVE
x logofacebook logolinkedin logoyoutube logo
ABOUT JoVE
OverviewLeadershipBlogJoVE Help Center
AUTHORS
Publishing ProcessEditorial BoardScope & PoliciesPeer ReviewFAQSubmit
LIBRARIANS
TestimonialsSubscriptionsAccessResourcesLibrary Advisory BoardFAQ
RESEARCH
JoVE JournalMethods CollectionsJoVE Encyclopedia of ExperimentsArchive
EDUCATION
JoVE CoreJoVE BusinessJoVE Science EducationJoVE Lab ManualFaculty Resource CenterFaculty Site
Terms & Conditions of Use
Privacy Policy
Policies

Related Concept Videos

Standing Waves in a Cavity01:28

Standing Waves in a Cavity

A household microwave and lasers are examples of standing electromagnetic waves in a cavity. When two conducting metal plates are placed parallel at the nodal planes, it creates a cavity where standing waves are formed. The cavity between the two planes is analogous to a stretched string held at the points x = 0 and x = L. Here, the distance 'L' between the two planes must be an integer multiple of half of the wavelength. The wavelengths that satisfy this condition are given by:

You might also read

Related Articles

Articles linked to this work by shared authors, journal, and citation graph.

Sort by
Same author

[Research advances in the adverse effects of azo dyes].

Zhonghua yu fang yi xue za zhi [Chinese journal of preventive medicine]·2020
Same author

Search for Higgs Boson Decays into a Z Boson and a Light Hadronically Decaying Resonance Using 13 TeV pp Collision Data from the ATLAS Detector.

Physical review letters·2020
Same author

[Gender disparities in acute coronary syndrome].

Zhonghua nei ke za zhi·2020
Same author

[Exploring the health education model for chronic hepatitis C micro-elimination in Guizhou Province from a global perspectives].

Zhonghua gan zang bing za zhi = Zhonghua ganzangbing zazhi = Chinese journal of hepatology·2020
Same author

Dijet Resonance Search with Weak Supervision Using sqrt[s]=13  TeV pp Collisions in the ATLAS Detector.

Physical review letters·2020
Same author

CP Properties of Higgs Boson Interactions with Top Quarks in the tt[over ¯]H and tH Processes Using H→γγ with the ATLAS Detector.

Physical review letters·2020
Same journal

Compressed multi-scale entropy and its application in mechanical fault diagnosis.

The Review of scientific instruments·2026
Same journal

Bidirectional drive and multi-resolution adjustment across frequency bands in inertial impact piezoelectric motors via multimodal resonant vibration.

The Review of scientific instruments·2026
Same journal

A magnetic field sensor based on flaky Terfenol-D material and dual fiber grating.

The Review of scientific instruments·2026
Same journal

A novel E-field eight-way cavity combiner for high-power S-band applications.

The Review of scientific instruments·2026
Same journal

Constant radius blade spring suspended bench for vibration isolation.

The Review of scientific instruments·2026
Same journal

Qualification of infrared optical fibers and emitters for a spectrometer for in situ planetary exploration: Results from the TRIS (TRansmission and Illumination System) project.

The Review of scientific instruments·2026
See all related articles

Related Experiment Video

Updated: Jun 23, 2026

Recombination Dynamics in Thin-film Photovoltaic Materials via Time-resolved Microwave Conductivity
11:30

Recombination Dynamics in Thin-film Photovoltaic Materials via Time-resolved Microwave Conductivity

Published on: March 6, 2017

Tapping mode microwave impedance microscopy.

K Lai1, W Kundhikanjana, H Peng

  • 1Department of Applied Physics, Geballe Laboratory for Advanced Materials, Stanford University, Stanford, California 94305, USA.

The Review of Scientific Instruments
|May 2, 2009
PubMed
Summary
This summary is machine-generated.

Tapping mode microwave impedance imaging using atomic force microscopy offers superior dielectric property measurements. This advanced technique eliminates thermal drift and provides accurate data on nanodevices.

More Related Videos

High-Speed Atomic Force Microscopy Imaging of DNA Three-Point-Star Motif Self Assembly Using Photothermal Off-Resonance Tapping
08:59

High-Speed Atomic Force Microscopy Imaging of DNA Three-Point-Star Motif Self Assembly Using Photothermal Off-Resonance Tapping

Published on: March 22, 2024

Carrier Lifetime Measurements in Semiconductors through the Microwave Photoconductivity Decay Method
07:38

Carrier Lifetime Measurements in Semiconductors through the Microwave Photoconductivity Decay Method

Published on: April 18, 2019

Related Experiment Videos

Last Updated: Jun 23, 2026

Recombination Dynamics in Thin-film Photovoltaic Materials via Time-resolved Microwave Conductivity
11:30

Recombination Dynamics in Thin-film Photovoltaic Materials via Time-resolved Microwave Conductivity

Published on: March 6, 2017

High-Speed Atomic Force Microscopy Imaging of DNA Three-Point-Star Motif Self Assembly Using Photothermal Off-Resonance Tapping
08:59

High-Speed Atomic Force Microscopy Imaging of DNA Three-Point-Star Motif Self Assembly Using Photothermal Off-Resonance Tapping

Published on: March 22, 2024

Carrier Lifetime Measurements in Semiconductors through the Microwave Photoconductivity Decay Method
07:38

Carrier Lifetime Measurements in Semiconductors through the Microwave Photoconductivity Decay Method

Published on: April 18, 2019

Area of Science:

  • Physics
  • Materials Science
  • Nanotechnology

Background:

  • Atomic Force Microscopy (AFM) is a powerful tool for nanoscale imaging.
  • Microwave impedance microscopy (MIM) enables electrical property mapping.
  • Combining AFM with MIM presents opportunities for enhanced nanoscale characterization.

Purpose of the Study:

  • To develop and demonstrate a tapping mode microwave impedance imaging technique.
  • To improve the accuracy and stability of nanoscale dielectric property measurements.
  • To validate the technique on thin-film dielectric samples and working nanodevices.

Main Methods:

  • Utilizing an atomic force microscope platform equipped with a shielded cantilever probe.
  • Implementing tapping mode operation to minimize tip-sample interaction area.
  • Employing finite-element analysis for simulating tip-sample impedance modulation.
  • Conducting quantitative comparison between simulated and experimental data.

Main Results:

  • Accurate simulation of modulated tip-sample impedance using finite-element analysis.
  • Quantitative agreement between simulation and experimental data for dielectric samples.
  • Elimination of long-term thermal drift, enabling absolute dielectric property measurements.
  • Successful demonstration of tapping mode images on working nanodevices.

Conclusions:

  • Tapping mode microwave impedance imaging provides a stable and accurate method for nanoscale dielectric characterization.
  • The technique overcomes limitations of contact mode, such as thermal drift.
  • The results are consistent with transport measurements, validating its utility for nanodevice analysis.