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Updated: Jun 23, 2026

Elemental-sensitive Detection of the Chemistry in Batteries through Soft X-ray Absorption Spectroscopy and Resonant Inelastic X-ray Scattering
Published on: April 17, 2018
X-ray- and electron-induced infrared emission spectroscopy
R A Rosenberg1, M Abu Haija, S P Watkins
1Advanced Photon Source, Argonne National Laboratory, Argonne, Illinois 60439, USA.
Abstract:
We demonstrate the use of Fourier transform infrared (IR) spectroscopy for midinfrared emission measurements following x-ray or electron excitation. Spectra from an InAs low band-gap semiconductor film, which emits in the IR from 3000 to 3400 cm(-1), are presented. There is good agreement between the present results and previously published laser-excited spectra. Using focused beams, it should be possible to perform sub-diffraction-limited IR imaging. In addition, simultaneous structural and electronic analysis could be performed using the x-ray or electron excitation probes.
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