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Elemental-sensitive Detection of the Chemistry in Batteries through Soft X-ray Absorption Spectroscopy and Resonant Inelastic X-ray Scattering
Published on: April 17, 2018
X-ray- and electron-induced infrared emission spectroscopy.
R A Rosenberg1, M Abu Haija, S P Watkins
1Advanced Photon Source, Argonne National Laboratory, Argonne, Illinois 60439, USA.
The Review of Scientific Instruments
|May 2, 2009
Summary
Fourier transform infrared (IR) spectroscopy enables mid-infrared emission measurements after X-ray or electron excitation. This technique shows promise for high-resolution IR imaging and simultaneous material analysis.
Area of Science:
- Materials Science
- Spectroscopy
- Solid-State Physics
Background:
- Fourier transform infrared (FTIR) spectroscopy is a powerful tool for chemical analysis.
- Mid-infrared (MIR) emission spectroscopy provides insights into material properties.
- X-ray and electron excitation are common methods for probing materials.
Purpose of the Study:
- To demonstrate the application of FTIR spectroscopy for mid-infrared emission measurements.
- To analyze the mid-infrared emission spectra of an Indium Arsenide (InAs) semiconductor film.
- To explore the potential for advanced imaging and analysis techniques.
Main Methods:
- Utilizing Fourier transform infrared (FTIR) spectroscopy for mid-infrared emission detection.
- Employing X-ray or electron beams for material excitation.
- Measuring emission spectra in the 3000 to 3400 cm(-1) range.
Main Results:
- Successfully obtained mid-infrared emission spectra from an InAs semiconductor film.
- Demonstrated good agreement between X-ray/electron-excited spectra and previously published laser-excited spectra.
- Identified the potential for sub-diffraction-limited infrared imaging.
Conclusions:
- FTIR spectroscopy is effective for mid-infrared emission analysis following X-ray or electron excitation.
- The technique offers potential for high-resolution infrared imaging.
- Simultaneous structural and electronic analysis is feasible with this excitation-based approach.
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