Related Experiment Video
Updated: Jun 23, 2026

All-electronic Nanosecond-resolved Scanning Tunneling Microscopy: Facilitating the Investigation of Single Dopant Charge Dynamics
Published on: January 19, 2018
Atomic scale imaging and spectroscopy of individual electron trap states using force detected dynamic tunnelling
J P Johnson1, N Zheng, C C Williams
1Department of Physics, University of Utah, Salt Lake City, UT 84112, USA.
Abstract:
We report the first atomic scale imaging and spectroscopic measurements of electron trap states in completely non-conducting surfaces by dynamic tunnelling force microscopy/spectroscopy. Single electrons are dynamically shuttled to/from individual states in thick films of hafnium silicate and silicon dioxide. The new method opens up surfaces that are inaccessible to the scanning tunnelling microscope for imaging and spectroscopy on an atomic scale.
Related Concept Videos
Mass Analyzers: Common Types
Overview of Microscopy Techniques
Atomic Force Microscopy
The AFM Probe
The probe is regarded as the heart of any AFM setup and comprises the...

