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Dense argon nano-inclusions in Verneuil-grown SrTiO3 single crystals
1Quantum Dot Research Center, National Institute for Materials Science, 3-13 Sakura, Tsukuba 305-0005, Japan.
Abstract:
High-quality SrTiO(3) single crystals grown by the Verneuil method have been examined by transmission electron microscopy combined with electron energy loss spectroscopy. Dense argon inclusions varying in size between 1 and 10 nm have been detected and attributed to the trapping of an Ar impurity from the process gases by the molten SrTiO(3). The implications of the high density of Ar in the inclusions to the melt-grown solids are discussed.
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