Optical and electrical characterization at the nanoscale with a transparent probe of a scanning tunnelling microscope

Ilya Sychugov1, Hiroo Omi, Tooru Murashita

  • 1NTT Basic Research Laboratories, NTT Corporation, Atsugi, Kanagawa 243-0198, Japan.

Nanotechnology
|May 8, 2009
PubMed