You might also read
Articles linked to this work by shared authors, journal, and citation graph.
Updated: Jun 23, 2026

Active Probe Atomic Force Microscopy with Quattro-Parallel Cantilever Arrays for High-Throughput Large-Scale Sample Inspection
Published on: June 13, 2023
Hui Xie1, Dogan Sinan Haliyo, Stéphane Régnier
1Institut des Systèmes Intelligents et de Robotique, Université Pierre et Marie Curie/CNRS UMR7222, Paris, France. xie@robot.jussieu.fr
A novel three-dimensional (3D) manipulation force microscope (3DMFM) enables precise pick-and-place nanomanipulation in air. This atomic force microscope modification facilitates 3D nanoassembly of structures like nanowire crosses.
08:59High-Speed Atomic Force Microscopy Imaging of DNA Three-Point-Star Motif Self Assembly Using Photothermal Off-Resonance Tapping
Published on: March 22, 2024
14:13Atomic Force Microscopy of Red-Light Photoreceptors Using PeakForce Quantitative Nanomechanical Property Mapping
Published on: October 24, 2014
Area of Science:
Background:
Purpose of the Study:
Main Methods:
Main Results:
Conclusions: